Competitive comparison of Measurement technologies from leading manufacturers
MEASUREMENT COMPARISON |
NUCLEAR |
LASER |
CONTACT |
UAI |
Corrects for fixture movement |
no |
no |
no |
yes |
Measure all material colors |
yes |
no |
yes |
yes |
Measure optically clear material |
yes |
no |
yes |
yes |
Measure shiny reflective surfaces |
yes |
no |
yes |
yes |
Measure non-reflective surfaces |
yes |
no |
yes |
yes |
Operate reliably in dirty environments |
yes |
no |
no |
yes |
Measure distance |
no |
yes |
yes |
yes |
Requires precise standoff |
yes |
no |
yes |
no |
Measure broad thickness/distance range |
no |
no |
no |
yes |
Large spot size |
no |
no |
no |
yes |
Fail safe features |
no |
no |
no |
yes |
Measure soft materials/surfaces |
yes |
yes |
no |
yes |
Ignore surface debris |
no |
no |
no |
yes |
Measure leading and trailing surfaces of panel |
yes |
yes |
no |
yes |
Affects surface of material measured |
no |
no |
yes |
no |
Requires heads to retract |
no |
no |
yes |
no |
Affected by product vibration |
no |
no |
yes |
no |
Automatically detect if gages are incorrectly operating |
no |
no |
no |
yes |
Scan in the cross machine direction |
yes |
yes |
no |
yes |
Requires hazard warnings |
yes |
yes |
no |
no |
Requires special regulations and permitting to install |
yes |
no |
no |
no |
Requires expensive disposal |
yes |
no |
no |
no |
Customer can purchase individual gages and components |
no |
yes |
yes |
yes |
Measure product thickness and distance |
no |
yes |
yes |
yes |
Full systems and system components available |
yes |
no |
yes |
yes |
Requires high contact pressure |
no |
no |
yes |
no |
Thickness measurement affected by density variation |
yes |
no |
yes |
no |
Affected by background noise and radiation |
yes |
yes |
no |
no |
Gage software prompts if gage is misaligned in collision |
no |
no |
no |
yes |
Requires long sampling time to reduce affect of noise |
yes |
yes |
yes |
no |